PV07400 - SEMI PV74 - Test Method for the Measurement of Chlorine in Silicon by Ion Chromatography Revision:SEMI PV74-0216 - Superseded Both parameters are part of

Both parameters are part of the specification for solar cell wafers (SEMI　PV22)

this TDDB test method has a higher sensitivity for detecting the accidental breakdown (B mode) than TZDB

semiconductor monosilicon and semiconductor polysilicon

This Standard was technically approved by the Photovoltaic – Materials Global Technical Committee

PV07400 - SEMI PV74 - Test Method for the Measurement of Chlorine in Silicon by Ion Chromatography Revision:SEMI PV74-0216 - Superseded Both parameters are part ofThe quality of polysilicon is very important for the user. More and more granular silicon is being produced and used to produce polysilicon for use in the photovoltaic industry. Research shows that more chlorine remains in granular silicon than in chunk silicon. Chlorine remaining in the silicon affects the quality. Thus, it is necessary to develop a method to measure the chlorine in silicon. This Test Method can facilitate unification of protocols