T01700 - SEMI T17 - Specification of Substrate Traceability Revision:SEMI T17-0706 (Reapproved 0923) - Current and Investment Castings for Components

and Investment Castings for Components Used in High Purity Semiconductor Manufacturing Applications

that can be used by all Standards defining public objects

This Specification covers requirements for silicon on insulator (SOI) for semiconductor power-device/IC manufacture

SEMI D19 — Test Method for Chemical Resistance of FPD Color Filter

T01700 - SEMI T17 - Specification of Substrate Traceability Revision:SEMI T17-0706 (Reapproved 0923) - Current and Investment Castings for ComponentsThe purpose of this Specification is to provide standard data representation and its communication of Die Trace Data for SEMI T13 Device Tracking Standard especially for substrate traceability. The final goal of this Standard is to realize the traceability of semiconductor, flat panel display (FPD), or MEMS devices as described in SEMI T13. This Standard clarifies a part of the traceability specific for substrate such as wafer or some other substrates