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この仕様では，ウェーハIDリーダによって送信される非同期メッセージは要件でもなく，定義することも禁止することもしない。
Maximum allowable slip and other non-uniformly distributed defects are frequently specified when procuring polished and epitaxial silicon wafers
Action limits are generally set to determine when system performance data warrants that corrective action is needed
These Specifications provide the essential dimensions and certain other common characteristics of polished single crystal silicon wafers for gallium nitride-on-silicon applications
T00800 - SEMI T8 - Specification for Marking of Glass Flat Panel Display Substrates with a Two-Dimensional Matrix Code Symbol StdPbc-0117 この仕様では，ウェーハIDリーダによって送信される非同期メッセージは要件でもなく，定義することも禁止することもしない。This Specification is intended to provide a marking symbology that can be used to mark glass flat panel display (FPD) substrates within the fixed quality area (FQA) of the edge exclusion area of the substrate. This Specification defines the geometric and spatial relationships and content (including the error checking and correcting code) of rectangular two dimensional (2D), machine readable, binary Data Matrix symbology for front surface or back
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