Semiconductor Environmental, Health and Safety at Work Part 3 StdPbc-0709 25 mm/166 mm ± 0

25 mm/166 mm ± 0

本測定は，過剰キャリア密度がウェーハ試料の場合は1 × 1013 cm-3～2 × 1016 cm-3，バルク試料（厚さ1 cm以上）の場合は1 × 1013 cm-3～5 × 1015 cm-3の範囲内で適用できる。

2005年11月29日，由全球稽核與評論子委員會認可後出版。此版本可以在2006年2月的網址www

SEMI MF397-0812 (Reapproved 0718)

Semiconductor Environmental, Health and Safety at Work Part 3 StdPbc-0709 25 mm/166 mm ± 0Course Description Think about all the equipment used in a semiconductor fabrication facility. Now think about the different types of hazardous energy used to operate that equipment. Take this course to learn about these hazards and what you can do to ensure the safety of everyone exposed to them. This course addresses explicitly hazardous energy types and regulations, energy isolating devices, and electrical safety. Ideal learners are semiconductor