C10500 - SEMI C105 - Guide for Trace Iron Analysis in High Purity 2-Propanol (IPA) Revision:SEMI C105-0923 - Current This identification is intended to

This identification is intended to occur both at the devices and at those places in the supplier-provided manuals where the devices are referenced in tasks or procedures

This Standard specifies the front-opening shipping box (FOSB) used to ship 450 mm wafers from wafer suppliers to their customers (typically IC manufacturers)

This Document specifies the data file format for transferring from test equipment to a Yield Management System

リクレームウェーハ（SEMI M38参照）

C10500 - SEMI C105 - Guide for Trace Iron Analysis in High Purity 2-Propanol (IPA) Revision:SEMI C105-0923 - Current This identification is intended toPurpose The purpose of this Guide is to recommend procedures for trace iron analysis in high purity 2 propanol (IPA) needed by the semiconductor industry. Scope The scope of this Guide is the measurement of iron concentration in IPA, used in the semiconductor industry, with higher purity than Grade 4 IPA described in SEMI C41. The quantitative range of this method is 1 to 100 ppt. Instruments (bottles, etc.) for sampling IPA to be analyzed are