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試験記録書の記載内容
root mean square deviation of the assessed profiles in nanometers
and the input and exit ports of production equipment or minienvironments
SEMI E126-0308 (technical revision)
G06500 - SEMI G65 - Lリード（ガルウイング型）パッケージ用リードフレーム材料の評価の試験方法 StdPbc-0914 試験記録書の記載内容global Assembly & Packaging Technical Committee201171global Audits and Reviews Subcommittee20118www. semiviews. org www. semi. org1996200411 : L Referenced SEMI Standards None.
