PV00900 - SEMI PV9 - 短時間光パルス照射後のマイクロ波反射率の非接触測定による，PVシリコン材料の過剰キャリア減衰（ライフタイム）試験方法 StdPbc-1121 5-0211 (Reapproved 0623)

5-0211 (Reapproved 0623)

SEMI D6-0308 (technical revision)

Two procedures for computing the results are provided

1  These test methods are both in use within the industry

PV00900 - SEMI PV9 - 短時間光パルス照射後のマイクロ波反射率の非接触測定による，PVシリコン材料の過剰キャリア減衰（ライフタイム）試験方法 StdPbc-1121 5-0211 (Reapproved 0623)global Photovoltaic Committee2011513global Audits and Reviews Subcommittee20116www. semiviews. org www. semi. org201010 () ((m PCD) Referenced SEMI Standards SEMI M59 Terminology for Silicon Technology SEMI MF42 Test Methods for Conductivity Type of Extrinsic Semiconducting Materials SEMI MF43 Test Methods for Resistivity of Semiconductor Materials SEMI MF84 Test Method for Measuring Resistivity of Silicon Wafers With an In Line Four Point Probe SEMI